웨스트팩

  제품사진 제품명
리스트 게시판
Mask(Reticle) Flatness Measurement
- Quartz(Glass) non-contact flatness measurement system
- Blank, Pellicle mounted mask and EUV mask
- FM200Mask, UltraFlat
Wafer Roughness Measurement

FlatMaster Ra

-White light interferometer

-Roughness Measurement

Wafer transition zone Measurement

UltraSort Roll-off Measurement

- Advanced Optical Measurement of Wafer Transition Zone
Corning Tropel

- Surface Flatness Measurement System

- Industrial Metrology

* Flat Master, MSP

- Semiconductor

* Flat Master, UltraSort, UltraFlat

- www.corning.com

Wafer Flatness Measurement
- Si, Sapphire, GaAs, SiC, GaN, LN, Quartz etc
- Sawing, Lapping, Polishing
- Process Development and IQC&OQC
- UltraSort150&200, FM200Wafer, FM-MSP300

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